Microscopy and Surface Analysis
Probe Scanning Microscopy
Microscopy and Surface Analysis
STM works by scanning a metal tip on the surface. By bringing the metal tip very close to the surface, and applying an electrical voltage to either the tip or the sample, an image of the surface can be obtained on an extremely small scale.
Compact equipment with an electronic resolution of 7.6pm x 7.6pm x 3.1pm used exclusively for conductive…
Compact and high resolution equipment with different working modes for different types of measurements…
Equipment fully equipped with more than 10 working modes, capable of supporting upgrades to work in inverted…
The fastest and most advanced equipment on the market, it has 17 working modes and the possibility of…
Surface Analysis
Microscopy and Surface Analysis
XPS is when an atom or molecule absorbs an X-ray photon and an electron is ejected. The kinetic energy (KE) of the electron depends on the energy of the photon (hv) and the bond energy (BE) of the electron. By measuring the kinetic energy of the emitted electrons, it is possible to determine which elements are near the surface, their chemical states and the bonding energy of the electron.
In a TOF-SIMS analysis, a solid surface is bombarded by primary ions of some energy keV. The energy of the primary ion is transferred to atoms of interest via atomic collisions and a collision cascade is generated. The interaction of the collision cascade with the surface molecules is smooth enough to allow even large, non-volatile molecules with masses up to 10,000µ to escape with little or no fragmentation.
In a LEIS analysis the sample surface is bombarded with noble gas ions and an energy of some keV. The ions are dispersed by the surface atoms according to the laws of conservation of energy and momentum. By measuring the energy of the backscattered ions, the mass of the scattered surface atoms is determined
The NEXSA system is the new fully automated multi-technique XPS model to which other techniques such as ISS…
The K-Alpha system has a high performance micro-focused X-ray monochromator that allows the user to fine…
Expandable, optimized, multi-technique instrumentation with unmatched flexibility and modularity, the ESCALAB…
The Qtac is a highly sensitive instrument. It is extremely sensitive to the surface, providing elemental and structural…
TOF.SIMS 5 is the latest generation of high-end TOF-SIMS instruments developed over the past 25 years…
Electronic Microscopy
Microscopy and Surface Analysis
In Scanning Electron Microscopy (SEM), low energy (less than 50 eV) secondary electrons are emitted from the sample surface and can be used to give a type of image.
The TM4000 Series features innovative, state-of-the-art technology that redefines the capabilities of a benchtop…
The FlexSEM 1000 VP-SEM combines innovative technology features with an intuitive interface, to provide…
