X-Ray Diffraction and Elemental Analysis

X-Ray Diffraction

X-Ray Diffraction and Elemental Analysis
Detailed analysis of any material, for fundamental research or industrial quality control, providing future solutions for today's users, with qualitative and quantitative applications that include:
- Phase identification
- Quantitative Analysis
- Determination of crystalline structures
- PDF analysis (total dispersion)
- Low Angle X-Ray Scatter (SAXS)
- X-Ray Reflectometry (XRR)
- High Resolution X-Ray Diffraction (HRXRD)
- Reciprocal Spatial Mapping (RSM)
- Residual voltage
- Texture (polar figures)
- X-Ray Fluorescence

X-Ray Fluorescence

X-Ray Diffraction and Elemental Analysis
Energy dispersive X-ray fluorescence (EDXRF) is the best choice for dedicated process and quality control applications that demand ease of use and compact size. It provides analytical flexibility for research and monitoring tasks. We also have wavelength dispersive X-ray fluorescence (WDXRF) instruments.

Optical Emission Spectrometry

X-Ray Diffraction and Elemental Analysis
OES covers the analysis of chemical elements and the full range from sub-ppm levels to percentages of both pure metal, trace analysis and high grade alloys. All important elements can be analyzed simultaneously.

Microtomography

X-Ray Diffraction and Elemental Analysis
Non-destructive 3D imaging based on Microcomputer Tomography. 3D X-ray microscopy only enables 3D imaging of the internal structure of your samples in a non-destructive way. The technological method on which it is based is micro-computerized tomography, a non-destructive imaging technology. This is the same method used for medical CT scans, but on a small scale and with massively increased resolution.

CS/ONH Analysis

X-Ray Diffraction and Elemental Analysis
Accurate and rapid elemental analysis of carbon, sulphur, oxygen, nitrogen and hydrogen. The concentration of Oxygen, Nitrogen and Hydrogen in metals and other inorganic materials is determined based on the inert gas fusion method (IGF). The solid sample is melted in a graphite crucible at high temperatures and transported to the detectors using a flow of carrier and process gases.