X-Ray Diffraction and Elemental Analysis

X-Ray Diffraction

X-Ray Diffraction and Elemental Analysis
Detailed analysis of any material, for fundamental research or industrial quality control, providing future solutions for today's users, with qualitative and quantitative applications that include:
- Phase identification
- Quantitative Analysis
- Determination of crystalline structures
- PDF analysis (total dispersion)
- Low Angle X-Ray Scatter (SAXS)
- X-Ray Reflectometry (XRR)
- High Resolution X-Ray Diffraction (HRXRD)
- Reciprocal Spatial Mapping (RSM)
- Residual voltage
- Texture (polar figures)
- X-Ray Fluorescence

CS/ONH Analysis

X-Ray Diffraction and Elemental Analysis
Accurate and rapid elemental analysis of carbon, sulphur, oxygen, nitrogen and hydrogen The concentration of Oxygen, Nitrogen and Hydrogen in metals and other inorganic materials is determined based on the inert gas fusion method (IGF). The solid sample is melted in a graphite crucible at high temperatures and transported to the detectors using a flow of carrier and process gases.