X-Ray Diffraction and Elemental Analysis

X-Ray Diffraction

X-Ray Diffraction and Elemental Analysis
Detailed analysis of any material, for fundamental research or industrial quality control, providing future solutions for today's users, with qualitative and quantitative applications that include:
- Phase identification
- Quantitative Analysis
- Determination of crystalline structures
- PDF analysis (total dispersion)
- Low Angle X-Ray Scatter (SAXS)
- X-Ray Reflectometry (XRR)
- High Resolution X-Ray Diffraction (HRXRD)
- Reciprocal Spatial Mapping (RSM)
- Residual voltage
- Texture (polar figures)
- X-Ray Fluorescence

X-500 Series

Latest Generation X-Ray Fluorescence equipment are the lightest (1.3 kg) and most powerful (50kV) on the market to cover the most…

X-200 Series

The X-200 and X-250 are SciAps’ workhorses with traditional XRF models. The versatility of these instruments, as well…

X-50

XRF of old-school PiN diode technology. Excellent choice when only basic alloy analysis of steels…

CS/ONH Analysis

X-Ray Diffraction and Elemental Analysis
Accurate and rapid elemental analysis of carbon, sulphur, oxygen, nitrogen and hydrogen The concentration of Oxygen, Nitrogen and Hydrogen in metals and other inorganic materials is determined based on the inert gas fusion method (IGF). The solid sample is melted in a graphite crucible at high temperatures and transported to the detectors using a flow of carrier and process gases.

Z-901 y Z-902

If the need for elemental material analysis is compromised by regulations on the use of radiation sources…

Z-200C+ y Z-902C

The Z-200C+ and Z-902C models are the only instruments on the market to offer high resolution carbon analysis…

Z-300 y Z-903

The Z-300 and Z-903 of the old and new family respectively are the most wide spectral range portable analyzers on the market…

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Z-901CSi

If the user is only interested in Carbon or Silicon analysis and wishes to complement an existing XRF, the Z-901CSi is the LIBS instrument par excellence…