XploRA Nano

AFM-Raman for Physical and Chemical imaging
Fully integrated system based on SmartSPM state of the art scanning probe microscope and XploRA Raman micro-spectrometer.
Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system.

Features:
Multi-sample analysis platform
Macro, micro and nano scale measurements can be performed on the same platform.

Ease-of-use
Fully automated operation, start measuring within minutes, not hours!

True confocality
High spatial resolution, automated mapping stages, full microscope visualization options.

High collection efficiency
Top-down and oblique Raman detection for optimum resolution and throughput in both co-localized and Tip-Enhanced measurements (Raman and Photoluminescence).

High spectral resolution
Ultimate spectral resolution performance, multiple gratings with automated switching, wide spectral range analysis for Raman and PL.

High spatial resolution
Nanoscale spectroscopic resolution (down to 10 nm) through Tip Enhanced Optical Spectroscopies (Raman and PhotoLuminescence).

Multi-technique / Multi-environment
Numerous SPM modes including AFM, conductive and electrical modes (cAFM, KPFM), STM, liquid cell and electrochemical environment, together with chemical mapping through TERS/TEPL. Full control of the 2 instruments through one workstation and a powerful software control, SPM and spectrometer can be operated simultaneously or independently

Robustness/Stability
High resonance frequency AFM scanners, operation far away from noises! High performance is obtained without active vibration isolation.