Authorized Distributors in USA and Latin America
F-3 series spectral reflectance instruments perform measurements of semiconductor and dielectric layers up to 3 mm thick. The F-3 has a spot diameter of 10 microns. With the F-3 you can easily measure materials that are impossible with other instruments and in a fraction of a second. It also has the ability to measure refractive index with a small software upgrade.
Senda de la Inspiración #27 Milenio 3, Fase B Sec 10 C.P. 76060 Queretaro, México Teléfono +52 (442) 114 6626
Av. López Mateos 1099 A-2 Colonia Margarita Salazar C.P. 66479 San Nicolás de los Garza, Nuevo León, México Teléfono +52 (81) 8345 1166