LCS-400 Series Analytical Probe Station with Laser Cutting Sytem

The LCS-4000 Series Analytical Probe Station with Laser Cutting System provides the user with maximum flexibility in cutting for semiconductor diagnostics, fault analysis, clipping, marking and top layer removal. All of these functions can be performed at the microscopic level in this single system, providing a high level of performance and remarkable ease of use. The LCS-4000 is offered as a motorized, semi-automatic or fully automated configuration system and can be easily configured for a wide range of applications with a variety of design options and accessories available.