Nanolithography Nanofrazor Explore

This well-established system provides total flexibility to address almost any research application that requires precisely defined nanostructures.
The “Explore” allows pattern and topography imaging with very high speed and accuracy. This is achieved by using an intelligent bending-based piezoelectric scanner design that combines high rigidity, zero mechanical friction and very low coupled motion to provide superior positioning accuracy. Low-noise, ultra-sensitive and temperature-compensated sensors with high bandwidth and exceptional linearity are integrated into the scanner to enable advanced closed-loop positioning control with full compensation of piezoelectric hysteresis and drag errors.