Authorized Distributors in USA and Latin America

P-17 Stylus Profiler

The P-17 profilometer offers the height measurement capability of a profile in steps and features force control throughout the scan, from a few nanometers to one millimeter for research and production environments. The system allows 2D and 3D measurements of profile height, roughness, arc and stress for scans longer than 200 mm in one operation.

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