Semi-Auto Closed Cycle Cryogenic Probe Station

CPS-XXX-CF-PLUS models allow fast and cost-effective testing of wafers and devices at cryogenic temperatures up to 9 K (single CCR system), 4.5 K (dual CCR system) or even below 4 K (triple CCR system). We offer systems for testing 100mm, 150mm, 200mm or 300mm wafers with optional load-locking capabilities. The systems can be configured with individual probe arms (optionally with wedge probes) or with card holders. Such systems are ideal for the emerging field of quantum computing as well as established fields of electronic superconductors.