Authorized Distributors in USA and Latin America


The IR-View combines AFM with IR spectroscopy (AFM-IR) to provide IR spectra with a spatial resolution of less than 10 nm. Its patented PiFM allows you to measure the near-field optical response of the sample with mechanical force detection, making it a robust and easy-to-use technique. Reliable and repeatable PiFM spectra from a region below 10 nm give nano-FTIR” spectra in less than 1 second.

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